Taeseong Yoon

Ph.D. Candidate  ·  Industrial & Systems Engineering  ·  KAIST

I am a Ph.D. candidate at KAIST, advised by Professor Heeyoung Kim in the Engineering Data Science Lab. My research focuses on uncertainty quantification (UQ) for deep learning — scalable, theoretically grounded frameworks for reliable predictions, with emphasis on evidential deep learning, efficient Bayesian inference, out-of-distribution detection, and robustness under distribution shift.

I am also interested in statistical machine learning for structured and industrial data, including multivariate time-series anomaly detection, class-imbalanced semi-supervised learning, and continuous causal effect estimation. Recent publications: Courtroom Analogy (ICML 2026), F‑EDL (NeurIPS 2025), DAEDL (ICML 2024).

Previously a research intern at Samsung Advanced Institute of Technology (SAIT) and SK Hynix, working on uncertainty-aware anomaly detection for semiconductor manufacturing.

Open to research discussions and collaborations — feel free to reach out.

Publications

2026

ICML 2026
ICML 2026 Uncertainty Quantification

Courtroom Analogy: A New Perspective on Uncertainty‑Aware Classification

Taeseong Yoon, Heeyoung Kim

International Conference on Machine Learning (ICML), 2026

IEEE TASE
IEEE TASE Time Series

Knowledge‑Assisted Multi‑Graph Structure Learning for Multivariate Time‑Series Anomaly Detection in Multi‑Stage Industrial Processes

Jaeyeong Lee*, Taeseong Yoon*, Wonmo Koo, Heeyoung Kim

IEEE Transactions on Automation Science and Engineering (TASE), 2026

2025

NeurIPS 2025
NeurIPS 2025 Uncertainty Quantification

Uncertainty Estimation by Flexible Evidential Deep Learning

Taeseong Yoon, Heeyoung Kim

Advances in Neural Information Processing Systems (NeurIPS), 2025

2024

ICML 2024
ICML 2024 Uncertainty Quantification

Uncertainty Estimation by Density‑Aware Evidential Deep Learning

Taeseong Yoon, Heeyoung Kim

Proceedings of the 41st International Conference on Machine Learning (ICML), 2024

Under Review

ACM CIKM
Time Series Under Review

Graph‑Transformer‑Enhanced Probabilistic State‑Space Models for Multivariate Time‑Series Anomaly Detection

W. Koo, J. Lee, T. Yoon, H. Kim

Under review — ACM CIKM

NeurIPS sub.
Robust DL Under Review

LALA: Learning‑Aware Logit Adjustment for Class‑Imbalanced Semi‑Supervised Learning

T. Park, T. Yoon, H. Kim

Under review — NeurIPS

In Preparation

prep.
Uncertainty Quantification

SCOPE: Support Calibrated Posterior Evidence for Second‑Order Uncertainty Quantification

Taeseong Yoon, Heeyoung Kim

In preparation

prep.
Causal Inference

Adaptive Variable Selection for Continuous Treatment Effect Estimation

H. Cho*, T. Yoon*, I. Jeong, H. Kim

In preparation

News

Research

My core focus is uncertainty quantification for deep learning — scalable, theoretically grounded methods for reliable predictions. I am broadly interested in statistical machine learning for complex structured and industrial data.

UQ & Bayesian ML

Uncertainty Quantification

Evidential deep learning, efficient Bayesian inference, OOD detection, and robustness under distribution shift.

Anomaly Detection

Time-Series & Industrial Data

Multivariate time-series anomaly detection including graph structure learning and probabilistic state-space models.

Statistical ML

Structured & Imbalanced Data

Class-imbalanced semi-supervised learning and continuous causal effect estimation.

Talks & Presentations

Education

  • Ph.D. Candidate, Industrial & Systems Engineering, KAIST — Advisor: Prof. Heeyoung Kim
  • B.S., Industrial & Systems Engineering, KAIST

Honors & Awards

  • Gold Reviewer, ICML 2026
  • Next‑Generation Engineering Researcher, IPSEK
  • Best Poster Award (3rd Prize), Samsung AI Forum
  • Finalist, Qualcomm Innovation Fellowship Korea
  • Dean's List, Dept. of Industrial & Systems Engineering, KAIST

Academic Service

  • Reviewer — ICML 2026 (Gold Reviewer); NeurIPS 2025, 2026
  • Reviewer — TMLR (2026–present)  ·  IISE Transactions  ·  Computers & Industrial Engineering  ·  Medical Image Analysis

Research & Industry Experience

  • Research Intern, Samsung Advanced Institute of Technology (SAIT) — ML Lab, AI Research Center Uncertainty-aware anomaly detection for semiconductor quality inspection.
  • Undergraduate Research Intern, Industrial Statistics Lab, KAIST Bayesian nonparametric modeling — Dirichlet process Gaussian mixture models.
  • Intern, SK Hynix — QA Team, Mobile DRAM Engineering Bank-address pattern analysis for fault detection in mobile DRAM quality data.

Teaching & Leadership

  • Lab Representative — Engineering Data Science Lab, KAIST
  • Teaching Assistant — Engineering Statistics I (IE241), KAIST
  • Academic Tutor — Engineering Statistics I & II (IE241/IE242), KAIST

Skills

  • Probabilistic ML  ·  Deep Learning  ·  Bayesian Statistics  ·  Uncertainty Quantification  ·  Time‑Series Analysis
  • Python PyTorch NumPy SciPy scikit-learn R LaTeX Git
  • Korean (Native)  ·  English (Fluent; TOEIC 895)