Taeseong Yoon

Ph.D. Candidate · Industrial & Systems Engineering · KAIST

Hi! I am a Ph.D. candidate at KAIST, advised by Professor Heeyoung Kim at the Industrial Statistics Lab. My research focuses on efficient uncertainty quantification (UQ) for modern deep learning — designing UQ methods that are scalable, practical, and reliable under distribution shift, class imbalance, and noisy labels.

I'm especially interested in single-pass UQ methods such as evidential deep learning, efficient Bayesian deep learning, and conformal prediction. More broadly, I'm drawn to robust AI systems — including time-series anomaly detection and learning under incomplete or imbalanced data. My recent work includes F‑EDL (NeurIPS 2025), DAEDL (ICML 2024), and the upcoming Courtroom Analogy framework (ICML 2026).

Previously, I was a research intern at Samsung Advanced Institute of Technology and SK Hynix, where I worked on uncertainty-based anomaly detection and quality testing for semiconductor manufacturing.

Currently open to research collaborations and post-doc / industry conversations.

news

view all news →

selected publications

Full list on Google Scholar. * equal contribution  ·  bold denotes me.

2026

ICML 2026 Uncertainty Quantification accepted

Courtroom Analogy: A New Perspective on Uncertainty‑Aware Classification

Taeseong Yoon, Heeyoung Kim

In International Conference on Machine Learning (ICML), 2026

A new framework for uncertainty-aware classification that reframes the prediction problem through a courtroom metaphor — separating evidence collection, deliberation, and verdict to produce more interpretable and well-calibrated predictions.

2025

NeurIPS 2025 Uncertainty Quantification

Uncertainty Estimation by Flexible Evidential Deep Learning

Taeseong Yoon, Heeyoung Kim

In Advances in Neural Information Processing Systems (NeurIPS), 2025

Extends evidential deep learning by predicting a flexible Dirichlet distribution over class probabilities, improving uncertainty generalization under classical, long-tailed, and noisy in-distribution settings.

2024

ICML 2024 Uncertainty Quantification

Uncertainty Estimation by Density‑Aware Evidential Deep Learning

Taeseong Yoon, Heeyoung Kim

In International Conference on Machine Learning (ICML), 2024

Improves evidential uncertainty estimation by incorporating feature-space density information at prediction time, alongside a new parameterization designed to improve classification and out-of-distribution detection.

Preprints & Under Review

arXiv Robust DL in prep.

LALA: Learning‑Aware Logit Adjustment for Class‑Imbalanced Semi‑Supervised Learning

T. Park, T. Yoon, H. Kim

To be submitted to NeurIPS 2026

arXiv Time Series under review

Graph‑Transformer‑Enhanced Probabilistic State‑Space Models for Multivariate Time‑Series Anomaly Detection

W. Koo, J. Lee, T. Yoon, H. Kim

Under review at KDD 2026

IEEE TASE Time Series major revision

Knowledge‑Assisted Multi‑Graph Structure Learning for Multivariate Time‑Series Anomaly Detection in Multi‑Stage Industrial Processes

J. Lee*, T. Yoon*, W. Koo, H. Kim

Major revision at IEEE Transactions on Automation Science and Engineering

view all publications →

research interests

Uncertainty Quantification

Single-pass UQ methods, evidential deep learning, efficient Bayesian deep learning, conformal prediction, and calibration of modern neural networks.

Robust Deep Learning

Learning under distribution shift, class imbalance, noisy labels, semi-supervised learning, and out-of-distribution detection.

Time Series Analysis

Multivariate time-series anomaly detection, graph structure learning, probabilistic state-space models, and industrial process monitoring.

talks

curriculum vitae

A condensed version. Download full CV (PDF) →

Awards

  • Finalist, Qualcomm Innovation Fellowship Korea
  • Best Poster Award (3rd Prize), Samsung AI Forum
  • Dean's List, KAIST ISE

Service

  • NeurIPS 2025, NeurIPS 2026, ICML 2026
  • IISE Transactions · Computers & Industrial Engineering · Medical Image Analysis

Experience

  • Research Intern, Samsung Advanced Institute of Technology — Machine Learning Lab, AI Research Center
    Uncertainty-based anomaly detection for automated quality testing in semiconductor manufacturing.
  • Research Intern, Industrial Statistics Lab, KAIST
    Bayesian nonparametrics and Dirichlet Process Gaussian Mixture Models.
  • Intern, SK Hynix — QA Team, Mobile DRAM Engineering
    Bank-address pattern analysis using sequential pattern mining.

Teaching

  • Teaching Assistant — Engineering Statistics 1 (IE241), KAIST
  • Tutor — Engineering Statistics 1 & 2 (IE241 / IE242), KAIST
  • Lab Representative — Industrial Statistics Lab, KAIST