Taeseong Yoon

Ph.D. Candidate in Industrial & Systems Engineering, KAIST

I am a Ph.D. candidate at KAIST, advised by Professor Heeyoung Kim in the Engineering Data Science Lab. My research focuses on uncertainty quantification (UQ) for deep learning, with an emphasis on scalable and theoretically grounded methods for reliable prediction, including evidential deep learning, efficient Bayesian deep learning, conformal prediction, and out-of-distribution detection. I am also interested in statistical machine learning for structured and industrial data, including time-series analysis, tabular foundation models, causal inference, and robust learning under distribution shift.

My current work focuses on post-hoc UQ for foundation models and, more broadly, on UQ for agentic AI systems.

Open to research discussions and collaborations. Feel free to reach out.

Publications

2026

ICML2026
Uncertainty quantification

Courtroom Analogy: New Perspective on Uncertainty-Aware Classification

Taeseong Yoon, Heeyoung Kim

Proceedings of the 43rd International Conference on Machine Learning (ICML), PMLR 306, 2026
CIKM2026
Time series

GT-PSSM: Unified Probabilistic Framework for Stochastic Dynamics Modeling and Dependency Learning in Multivariate Time Series Anomaly Detection

Wonmo Koo, Jaeyeong Lee, Taeseong Yoon, Heeyoung Kim

35th ACM International Conference on Information and Knowledge Management (CIKM), Rome, Italy, 2026
IEEE TASE2026
Time series

Knowledge-Assisted Multi-Graph Dependency Learning for Multivariate Time Series Anomaly Detection in Multi-Stage Industrial Processes

Jaeyeong Lee*, Taeseong Yoon*, Wonmo Koo, Heeyoung Kim

IEEE Transactions on Automation Science and Engineering, 2026

2025

NeurIPS2025
Uncertainty quantification

Uncertainty Estimation by Flexible Evidential Deep Learning

Taeseong Yoon, Heeyoung Kim

Advances in Neural Information Processing Systems 38 (NeurIPS), 2025

2024

ICML2024
Uncertainty quantification

Uncertainty Estimation by Density-Aware Evidential Deep Learning

Taeseong Yoon, Heeyoung Kim

Proceedings of the 41st International Conference on Machine Learning (ICML), PMLR 235, 2024

Under review

ICLR2027
Uncertainty quantificationUnder review

Separating Prediction from Epistemic Uncertainty in Evidential Deep Learning

Taeseong Yoon, Seungjun Choi, Heeyoung Kim

Submitted to ICLR 2027
ICLR2027
Imbalanced learningUnder review

Strong Views for Representation, Weak Views for Classification: Rethinking Augmentation in Class-Imbalanced Semi-Supervised Learning

Taemin Park, Taeseong Yoon, Heeyoung Kim

Submitted to ICLR 2027
AISTATS2027
Causal inferenceUnder review

Causal Role-Aware Variable Selection for Continuous Treatment Effect Estimation

Hyunsoo Cho*, Taeseong Yoon*, Insoo Jeong*, Heeyoung Kim

Submitted to AISTATS 2027

News

Research

My work develops efficient and faithful uncertainty quantification for deep learning, and applies the same concern for reliability to structured and industrial data.

Uncertainty quantification

Evidential deep learning, efficient Bayesian inference, and second-order uncertainty; post-hoc UQ for foundation models and UQ for agentic AI systems.

Time-series and tabular learning

Multivariate time-series anomaly detection for manufacturing, tabular foundation models, and conformal prediction.

Causal and robust learning

Causal inference and learning under class imbalance, incomplete data, and limited supervision.

Talks & presentations

Education

  • Ph.D. Candidate, Industrial & Systems Engineering, KAIST — Advisor: Prof. Heeyoung Kim
  • B.S., Industrial & Systems Engineering, KAIST

Honors & awards

  • Gold Reviewer, ICML 2026
  • Next-Generation Engineering Researcher, IPSEK
  • Best Poster Award (3rd Prize), Samsung AI Forum
  • Finalist, Qualcomm Innovation Fellowship Korea
  • Dean's List, Dept. of Industrial & Systems Engineering, KAIST

Academic service

  • Reviewer: ICML 2026 (Gold Reviewer), NeurIPS 2025–2026
  • Reviewer: TMLR, IISE Transactions, Computers & Industrial Engineering, Medical Image Analysis

Research & industry experience

  • Research Intern, Samsung Advanced Institute of Technology (SAIT) — Machine Learning Lab, AI Research CenterUncertainty-aware anomaly detection for semiconductor quality inspection.
  • Undergraduate Research Intern, Industrial Statistics Lab, KAISTBayesian nonparametric modeling with Dirichlet process Gaussian mixture models.
  • Intern, SK Hynix — QA Team, Mobile DRAM EngineeringBank-address pattern analysis for fault detection in mobile DRAM quality data.